I have detected a Data corruption in RAM in one of STM32 based device.
The issue is very rare and not reproducible. In one device, I have seen only single bit corruption. But it causes a lot of damage. From the behavior of other corrupted devices, I understand similar but not the same data corruption occured in the same region.
The corrupted value belongs to a static global array, which isn't modified in run time. From the Map file, I can see the array is placed in RAM base address.
I want to find out root cause of this corruption. What might be the most efficient way to go for this?
Project is developed using IAR EW for ARM and I am using ST-Link V2 Debugger.